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NISP Lab SEM Short Course
Tuesday, June 11, 2013
NISP Lab
For More Information:
Wen-An Chiou
301 405 0541
wachiou@umd.edu
http://www.nanocenter.umd.edu/labs/NISP/events/2013-short-courses.php#sem
SEM Short Course
The NISP Lab at NanoCenter will be offering a short course in Scanning Electron Microscopy (SEM) during this summer break (2013) using our state-of-the-art Hitachi SU-70 High Resolution Analytical SEM.
The short course provides an introduction to the SEM for those with little or no prior experience. This course covers basic principles and knowledge of the scanning electron microscope including energy-dispersive x-ray spectroscopy (EDS). In addition to lectures, there will be an emphasis on hands-on laboratory exercises that focus on instrument operation and practical applications. Students have the opportunity to study their own samples, or test samples provided by the Lab. At the end of the course, students with no prior experience are able to align a SEM, obtain secondary and backscattering electron images, and perform EDS analysis.
| Date: | Four days, June 11, 12, 13 and 14, 2013 |
| Lecture: | 9:30 to 11:30 am. (Room: TBA) |
| Laboratory: | Two hours/group/day (4 days, June 11. 12, 13 and 14, 2013) |
| Limit: | Maximum enrollment is 9 (3 lab groups, 3 persons per group) |
| Fee: | $350 per person, $300 per person from the same research group and/or participate TEM short course. $175 per person for taking lectures only. Fees for non-UMD participants will be different. Please check with the NISP Lab office. |
To enroll, please print and fill out the required application form, and submit to the NISP Lab office by 5:00 pm, June 7, 2013 in room 1234 Kim Building.
Students accepted into the class will be informed by e-mail by Sunday (06/09/13).
For more information regarding the SEM short course, please contact Wen-An Chiou at NISP Lab, or at (301)-405-0541 or send an e-mail to wachiou@umd.edu.
This Event is For: Graduate

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