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NISP Lab FIB Short Course
Sunday, June 16, 2013
NISP Lab
For More Information:
Wen-An Chiou
301 405 0541
wachoiu@umd.edu
http://www.nanocenter.umd.edu/labs/NISP/events/2013-short-courses.php#fib
FIB Short Course
Focus Ion Beam (FIB) is an extremely useful and powerful tool in physical/materials science and engineering research. The NISP Lab at NanoCenter will be offering a short course in FIB during this summer break (2013) using FEI 620 BualBeam FIB system.
The short course provides an introduction to the FIB for those with little or no prior experience. This course covers basic principles and knowledge of the FIB and how to operate a FIB instrument. In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications. At the end of the course, students with no prior experience are able to align a FIB and associated SEM, obtain SEM and FIB images, and carry out basic operation of FIB.
| Date: | Four days, July 16, 17, 18 and 19, 2013 |
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| Lecture: | 9:30 to 11:30 am. (July 16, 17, 18 and 19) (Room: TBA) |
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| Laboratory: | Two hours/group/day (4 days, July 16, 17, 18, and 19, 2013) |
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| Limit: | Maximum enrollment is 9 (3 lab groups, 3 persons per group) |
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| Fee: | $350 per person, $300 per person from the same research group. Fees for non-UMD participants will be different. Please check with the NISP Lab office. |
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| Prerequisite: | Must have SEM experience or permission from instructor. |
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To enroll, please print and fill out the required application form, and submit to the NISP Lab office by 5:00 pm, July 9, 2013 (at room 1234 Kim Building). Students accepted into the class will be informed by e-mail by noon on Friday (07/12/13).
For more information regarding the FIB short course, please contact Wen-An Chiou at NISP Lab, or (301)-405-0541 or send an e-mail to wachiou@umd.edu.
This Event is For: Graduate
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